Overview of functions
The functionality of the EL5072 is summarized in the following table. A detailed description can be found in the individual chapters.
Function | Description |
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Parameterization for evaluation of the measuring probe | LVDT, inductive half bridges and RVDT sensors can be connected and evaluated. |
The input signal can be filtered by specifying a mechanical cut-off frequency. | |
The position direction can be adapted to the application. | |
The measured value is output as a position value. | |
Exceeding and falling below the maximum counter depth are displayed in a separate process data. | |
The position value can be set to a specified value at runtime via the process data or the digital input. | |
The current position value can be saved, independent of the cycle time, in a separate process data via an edge at the digital input. | |
It is possible to parameterize a user calibration via offset and gain values or via a lookup table. | |
Different diagnostic data are available. In this way, a short circuit on the primary side and an amplitude error on the secondary side can be detected. |
Process data | Description |
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The scope of the process data can be selected via "Predefined PDO Assignment". | |
Frame-triggered operating mode (SM mode) and time-synchronous recording of the latch timestamp signal (DC latch active) are available. |
Digital input | Description |
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The digital input can be used to set and save the position value. |