Measurement ±40 mV

Measuring range, nominal

-40…+40 mV

Measuring range, end value (full scale value)

40 mV

Measuring range, technically usable

-42.95…+42.95 V

PDO resolution

24 bit (including sign)

PDO LSB (Extended Range)

5.12 nV

PDO LSB (Legacy Range)

4.768.. nV

Basic accuracy: Measuring deviation at 23°C, with averaging

< ±0.02%_FSV = ±200 ppm_FSV

Offset/Zero Point deviation (at 23°C)

E_Offset

< 175 ppm_FSV

Gain/scale/amplification deviation (at 23°C)

E_Gain

< 65 ppm

Non-linearity over the whole measuring range

E_Lin

< 45 ppm_FSV

Repeatability

E_Rep

< 30 ppm_FSV

Noise (without filtering)

E_{Noise, PtP}

< 375 ppm_FSV

< 2930 [digits]

E_{Noise, RMS}

< 75 ppm_FSV

< 586 [digits]

Max. SNR

> 82.5 dB

Noisedensity@1kHz

< 42.43

Noise (with 50Hz FIR filtering)

E_{Noise, PtP}

< 40 ppm_FSV

< 313 [digits]

E_{Noise, RMS}

< 5.5 ppm_FSV

< 43 [digits]

Max. SNR

> 105.2 dB

Temperature coefficient

Tc_Gain

< 8 ppm/K typ.

Tc_Offset

< 6 ppm_FSV/K typ.

Common-mode rejection ratio (without filtering)

DC: >115 dB typ.

50 Hz: >105 dB typ.

1 kHz: >80 dB typ.

Common-mode rejection ratio (with 50Hz FIR filtering)

DC: >115 dB typ.

50 Hz: >115 dB typ.

1 kHz: >115 dB typ.

Largest short-term deviation during a specified electrical interference test

±0.1%_FSV = ±1000 ppm_FSV typ.

Input impedance ±Input 1

(Internal resistance)

Differential 4.1 MΩ || 11 nF typ.

CommonMode 1 MΩ || 40 nF typ.
Methodology: Resistor against -U_V, capacitance against SGND

Input impedance ±Input 2

No usage of this input in this mode