Measurement SG 1/4-Bridge (quarter bridge) 2/3-wire connection

Notes

To calculate the quarter-bridge:

Measurement SG 1/4-Bridge (quarter bridge) 2/3-wire connection 1:
Connection of the quarter bridge

Explanation:

 

The strain relationship (µStrain, µε) is as follows:

Measurement SG 1/4-Bridge (quarter bridge) 2/3-wire connection 2:

For the quarter-bridge, N=1 always applies.

The relationship between UBridge/UExc and ∆R1 is non-linear:

Measurement SG 1/4-Bridge (quarter bridge) 2/3-wire connection 3:
Relationship between UBridge/UExc and ∆R1

The ELM350x devices apply internal linearization so that the output is already linearized

Measurement SG 1/4-Bridge (quarter bridge) 2/3-wire connection 4:

since the internal calculation is based on UExc'.

Measurement mode

StrainGauge/SG ¼-bridge 120 Ω 2/3-wire

 

32 mV/V

8 mV/V

4 mV/V (comp.) 5)

2 mV/V (comp.) 5)

Measuring range, nominal

±32 mV/V [corresponds to ±64,000 µε at K=2]

120 ± 15.36 Ω

±8 mV/V [corresponds to ±16,000 µε at K=2]

120 ± 3.84 Ω

±4 mV/V [corresponds to ±8,000 µε at K=2]

120 ± 1.92 Ω

±2 mV/V [corresponds to ±4,000 µε at K=2]

120 ± 0.96 Ω

Measuring range, end value (FSV)

32 mV/V

8 mV/V

4 mV/V

2 mV/V

Measuring range, technically usable

±34.359… mV/V

±8.589… mV/V

±4.294… mV/V

±2.147… mV/V

PDO resolution

24 bit (including sign)

PDO LSB (Extended Range)

0.128 ppm
4.096 nV/V

0.128 ppm
1.024 nV/V

0.128 ppm
0.512 nV/V

0.128 ppm
0.256 nV/V

PDO LSB (Legacy Range)

0.119… ppm
3.814… nV/V

0.119… ppm
0.9535… nV/V

0.119… ppm
0.47675… nV/V

0.119… ppm
0.238375… nV/V

Specific data

Measurement mode

Measuring bridge/StrainGauge SG ¼-bridge 120 Ω 2/3-wire

 

32 mV/V

8 mV/V

4 mV/V 5) (comp.)

2 mV/V 5) (comp.)

Basic accuracy: Measuring deviation at 23°C, with averaging, typ. 2)

without Offset

< ±0.026 %FSV
< ±260 ppmFSV
< ±8.3 µV/V

< ±0.08 %FSV
< ±800 ppmFSV
< ±6.4 µV/V

< ±0.16 %FSV
< ±1600 ppmFSV
< ±6.4 µV/V

< ±0.32 %FSV
< ±3200 ppmFSV
< ±6.4 µV/V

incl. Offset

< ±0.1 %FSV
< ±1000 ppmFSV
< ±32.0 µV/V

< ±0.4 %FSV
< ±4000 ppmFSV
< ±32.0 µV/V

< ±0.8 %FSV
< ±8000 ppmFSV
< ±32.0 µV/V

< ±1.6 %FSV
< ±16000 ppmFSV
< ±32.0 µV/V

Extended basic accuracy: Measuring deviation at 0…55°C, with averaging, typ. 2) 6)

without Offset

< ±0.1745 %FSV
< ±1745 ppmFSV
< ±55.8 µV/V

< ±0.6015 %FSV
< ±6015 ppmFSV
< ±48.1 µV/V

< ±1.203 %FSV
< ±12030 ppmFSV
< ±48.1 µV/V

< ±2.406 %FSV
< ±24060 ppmFSV
< ±48.1 µV/V

incl. Offset

< ±0.1995 %FSV
< ±1995 ppmFSV
< ±63.8 µV/V

< ±0.718 %FSV
< ±7180 ppmFSV
< ±57.4 µV/V

< ±1.436 %FSV
< ±14360 ppmFSV
< ±57.4 µV/V

< ±2.872 %FSV
< ±28720 ppmFSV
< ±57.4 µV/V

Offset/Zero point deviation (at 23°C) 4)

EOffset

< 960 ppmFSV

< 3920 ppmFSV

< 7840 ppmFSV

< 15680 ppmFSV

Gain/scale/amplification deviation (at 23°C)

EGain

< 160 ppm

< 440 ppm

< 880 ppm

< 1760 ppm

Non-linearity over the whole measuring range

ELin

< 200 ppmFSV

< 650 ppmFSV

< 1300 ppmFSV

< 2600 ppmFSV

Repeatability, over 24 h, with averaging

ERep

< 25 ppmFSV

< 100 ppmFSV

< 200 ppmFSV

< 400 ppmFSV

Noise (without filtering, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Noisedensity@1kHz

< tbd.

< tbd.

< tbd.

< tbd.

Noise (with 50 Hz FIR filter, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Common-mode rejection ratio (without filtering) 3)

tbd.

tbd.

tbd.

tbd.

Common-mode rejection ratio (with 50 Hz FIR filter) 3)

tbd.

tbd.

tbd.

tbd.

Temperature coefficient, typ.

TcGain

< 20 ppm/K

< 48 ppm/K

< 96 ppm/K

< 192 ppm/K

TcOffset

< 50 ppmFSV /K
< 1.60 µV/V/K

< 180 ppmFSV /K
< 1.44 µV/V/K

< 360 ppmFSV /K
< 1.44 µV/V/K

< 720 ppmFSV /K
< 1.44 µV/V/K

Largest short-term deviation during a specified electrical interference test

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

Input impedance ±Input 1

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

Input impedance ±Input 2

3-wire

 

 

 

 

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

Measurement mode

StrainGauge/SG ¼-bridge 350 Ω 2/3-wire

 

32 mV/V

8 mV/V

4 mV/V (comp.) 5)

2 mV/V (comp.) 5)

Measuring range, nominal

±32 mV/V [corresponds to ±64,000 µε at K=2]

350 ± 44.8 Ω

±8 mV/V [corresponds to ±16,000 µε at K=2]

350 ± 11.2 Ω

±4 mV/V [corresponds to ±8,000 µε at K=2]

350 ± 5.6 Ω

±2 mV/V [corresponds to ±4,000 µε at K=2]

350 ± 2.8 Ω

Measuring range, end value (FSV)

32 mV/V

8 mV/V

4 mV/V

2 mV/V

Measuring range, technically usable

±34.359… mV/V

±8.589… mV/V

±4.294… mV/V

±2.147… mV/V

PDO resolution

24 bit (including sign)

PDO LSB (Extended Range)

0.128 ppm
4.096 nV/V

0.128 ppm
1.024 nV/V

0.128 ppm
0.512 nV/V

0.128 ppm
0.256 nV/V

PDO LSB (Legacy Range)

0.119… ppm
3.814… nV/V

0.119… ppm
0.9535… nV/V

0.119… ppm
0.47675… nV/V

0.119… ppm
0.238375… nV/V

Specific data

Measurement mode

Measuring bridge/StrainGauge SG ¼-bridge 350 Ω 2/3-wire

 

32 mV/V

8 mV/V

4 mV/V 5) (comp.)

2 mV/V 5) (comp.)

Basic accuracy: Measuring deviation at 23°C, with averaging, typ. 2)

without Offset

< ±0.022 %FSV
< ±220 ppmFSV
< ±7.0 µV/V

< ±0.08 %FSV
< ±800 ppmFSV
< ±6.4 µV/V

< ±0.16 %FSV
< ±1600 ppmFSV
< ±6.4 µV/V

< ±0.32 %FSV
< ±3200 ppmFSV
< ±6.4 µV/V

incl. Offset

< ±0.1 %FSV
< ±1000 ppmFSV
< ±32.0 µV/V

< ±0.4 %FSV
< ±4000 ppmFSV
< ±32.0 µV/V

< ±0.8 %FSV
< ±8000 ppmFSV
< ±32.0 µV/V

< ±1.6 %FSV
< ±16000 ppmFSV
< ±32.0 µV/V

Extended basic accuracy: Measuring deviation at 0…55°C, with averaging, typ. 2) 6)

without Offset

< ±0.106 %FSV
< ±1060 ppmFSV
< ±33.9 µV/V

< ±0.395 %FSV
< ±3950 ppmFSV
< ±31.6 µV/V

< ±0.79 %FSV
< ±7900 ppmFSV
< ±31.6 µV/V

< ±1.5795 %FSV
< ±15795 ppmFSV
< ±31.6 µV/V

incl. Offset

< ±0.144 %FSV
< ±1440 ppmFSV
< ±46.1 µV/V

< ±0.5565 %FSV
< ±5565 ppmFSV
< ±44.5 µV/V

< ±1.113 %FSV
< ±11130 ppmFSV
< ±44.5 µV/V

< ±2.2255 %FSV
< ±22255 ppmFSV
< ±44.5 µV/V

Offset/Zero point deviation (at 23°C) 4)

EOffset

< 970 ppmFSV

< 3920 ppmFSV

< 7840 ppmFSV

< 15680 ppmFSV

Gain/scale/amplification deviation (at 23°C)

EGain

< 120 ppm

< 380 ppm

< 760 ppm

< 1520 ppm

Non-linearity over the whole measuring range

ELin

< 180 ppmFSV

< 750 ppmFSV

< 1500 ppmFSV

< 3000 ppmFSV

Repeatability, over 24 h, with averaging

ERep

< 25 ppmFSV

< 100 ppmFSV

< 200 ppmFSV

< 400 ppmFSV

Noise (without filtering, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Noisedensity@1kHz

< tbd.

< tbd.

< tbd.

< tbd.

Noise (with 50 Hz FIR filter, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Common-mode rejection ratio (without filtering) 3)

tbd.

tbd.

tbd.

tbd.

Common-mode rejection ratio (with 50 Hz FIR filter) 3)

tbd.

tbd.

tbd.

tbd.

Temperature coefficient, typ.

TcGain

< 12 ppm/K

< 50 ppm/K

< 100 ppm/K

< 200 ppm/K

TcOffset

< 30 ppmFSV /K
< 0.96 µV/V/K

< 110 ppmFSV /K
< 0.88 µV/V/K

< 220 ppmFSV /K
< 0.88 µV/V/K

< 440 ppmFSV /K
< 0.88 µV/V/K

Largest short-term deviation during a specified electrical interference test

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

Input impedance ±Input 1

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

Input impedance ±Input 2

3-wire

 

 

 

 

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

Measurement mode

StrainGauge/SG 1/4 Bridge 1 kΩ (2/3 wire)

32 mV/V FSV

8 mV/V FSV

4 mV/V FSV 5) (comp.)

2 mV/V FSV 5) (comp.)

Measuring range, nominal

±32 mV/V [corresponds to ±64,000 µε at K=2]

1000 ± 128 Ω

±8 mV/V [corresponds to ±16,000 µε at K=2]

1000 ± 32 Ω

±4 mV/V [corresponds to ±8,000 µε at K=2]

1000 ± 16 Ω

±2 mV/V [corresponds to ±4,000 µε at K=2]

1000 ± 8 Ω

Measuring range, end value (FSV)

32 mV/V

128 Ω

8 mV/V

32 Ω

4 mV/V

16 Ω

2 mV/V

8 Ω

Measuring range, technically usable

±34.359... mV/V

±8.589... mV/V

±4.294... mV/V

±2.147... mV/V

PDO resolution

24 Bit (incl. sign)

PDO LSB (Extended Range)

0.128 ppm
4.096 nV/V

0.128 ppm
1.024 nV/V

0.128 ppm
0.512 nV/V

0.128 ppm
0.256 nV/V

PDO LSB (Legacy Range)

0.119… ppm
3.814.. nV/V

0.119… ppm
0.9535 nV/V

0.119… ppm
0.47675 nV/V

0.119… ppm
0.238375 nV/V

Specific data

Measurement mode

Measuring bridge/StrainGauge SG ¼-bridge 1 kΩ 2/3-wire

 

32 mV/V

8 mV/V

4 mV/V 5) (comp.)

2 mV/V 5) (comp.)

Basic accuracy: Measuring deviation at 23°C, with averaging, typ. 2)

without Offset

< ±0.02 %FSV
< ±200 ppmFSV
< ±6.4 µV/V

< ±0.065 %FSV
< ±650 ppmFSV
< ±5.2 µV/V

< ±0.13 %FSV
< ±1300 ppmFSV
< ±5.2 µV/V

< ±0.26 %FSV
< ±2600 ppmFSV
< ±5.2 µV/V

incl. Offset

< ±0.1 %FSV
< ±1000 ppmFSV
< ±32.0 µV/V

< ±0.4 %FSV
< ±4000 ppmFSV
< ±32.0 µV/V

< ±0.8 %FSV
< ±8000 ppmFSV
< ±32.0 µV/V

< ±1.6 %FSV
< ±16000 ppmFSV
< ±32.0 µV/V

Extended basic accuracy: Measuring deviation at 0…55°C, with averaging, typ. 2) 6)

without Offset

< ±0.1975 %FSV
< ±1975 ppmFSV
< ±63.2 µV/V

< ±0.7435 %FSV
< ±7435 ppmFSV
< ±59.5 µV/V

< ±1.4865 %FSV
< ±14865 ppmFSV
< ±59.5 µV/V

< ±2.973 %FSV
< ±29730 ppmFSV
< ±59.5 µV/V

incl. Offset

< ±0.2205 %FSV
< ±2205 ppmFSV
< ±70.6 µV/V

< ±0.8415 %FSV
< ±8415 ppmFSV
< ±67.3 µV/V

< ±1.683 %FSV
< ±16830 ppmFSV
< ±67.3 µV/V

< ±3.366 %FSV
< ±33660 ppmFSV
< ±67.3 µV/V

Offset/Zero point deviation (at 23°C) 4)

EOffset

< 980 ppmFSV

< 3940 ppmFSV

< 7880 ppmFSV

< 15760 ppmFSV

Gain/scale/amplification deviation (at 23°C)

EGain

< 105 ppm

< 305 ppm

< 610 ppm

< 1220 ppm

Non-linearity over the whole measuring range

ELin

< 165 ppmFSV

< 560 ppmFSV

< 1120 ppmFSV

< 2240 ppmFSV

Repeatability, over 24 h, with averaging

ERep

< 25 ppmFSV

< 120 ppmFSV

< 240 ppmFSV

< 480 ppmFSV

Noise (without filtering, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Noisedensity@1kHz

< tbd.

< tbd.

< tbd.

< tbd.

Noise (with 50 Hz FIR filter, at 23°C)

ENoise, PtP

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

ENoise, RMS

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

< tbd. ppmFSV
< tbd. digits
< tbd. µV/V

Max. SNR

> tbd. dB

> tbd. dB

> tbd. dB

> tbd. dB

Common-mode rejection ratio (without filtering) 3)

tbd.

tbd.

tbd.

tbd.

Common-mode rejection ratio (with 50 Hz FIR filter) 3)

tbd.

tbd.

tbd.

tbd.

Temperature coefficient, typ.

TcGain

< 13 ppm/K

< 25 ppm/K

< 50 ppm/K

< 100 ppm/K

TcOffset

< 60 ppmFSV /K
< 1.92 µV/V/K

< 230 ppmFSV /K
< 1.84 µV/V/K

< 460 ppmFSV /K
< 1.84 µV/V/K

< 920 ppmFSV /K
< 1.84 µV/V/K

Largest short-term deviation during a specified electrical interference test

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

tbd. %FSV

 

Input impedance ±Input 1

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

Input impedance ±Input 2

3-wire

 

 

 

 

Differential

tbd.

tbd.

tbd.

tbd.

CommonMode

tbd.

tbd.

tbd.

tbd.

2) In real bridge measurement, an offset adjustment is usually carried out after installation. The given offset specification of the terminal is therefore practically irrelevant. Therefore, specification values with and without offset are given here. In practice, the offset component can be eliminated by the functions ELM Features and also ELM Features of the terminal or in the controller by a higher-level tare function. The offset deviation of a bridge measurement over time can change, therefore Beckhoff recommends a regular offset adjustment or careful observation of the change.

3) Values related to a common mode interference between SGND and internal ground.

4) The offset specification does not apply to 2-wire operation, since the offset is increased on the device side. Therefore, a system-side offset adjustment is recommended, see Tare- or ZeroOffset function. The final targeting basic acuuracy within the 2-wire operation is mainingly dependent by the quality of this system-side offset adjustment.

5) The channel measures electrically to 8 mV/V, but displays its measured value scaled to 2 or 4 mV/V. The Compensated function facilitates measurement of low levels even with high offset.

6) Calculated value according to equation in chapter "General information on measuring accuracy/measurement uncertainty" for quick estimation of usability over the specified ambient temperature range in operation (Tambient). In real use, for example at a relatively constant ambient temperature Tambient, a lower (better) achievable uncertainty is attained. A specific calculation according to chapter "General information on measuring accuracy/measurement uncertainty" is recommended, especially if the instrument allows a wider ambient temperature range in operation than 0...55 °C.

Notice

Transition resistances of the connection contacts

The transition resistance values of the connection contacts affect the measurement. The measuring accuracy can be further increased by a user-side adjustment with the signal connection plugged in.

The temperature sensitivity of the terminal and thus of the measurement setup can be reduced if an external, more temperature-stable supplementary resistor is used for operation of the terminal in half-bridge or even full-bridge mode instead of the internal supplementary resistor for quarter-bridge mode.